C. Giannakopoulos

2001
1		M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, J. Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)

Coauthor Index

1	B. Cretu	[1]
2	T. Devoivre	[1]
3	M. Fadlallah	[1]
4	G. Ghibaudo	[1]
5	J. Jomaah	[1]
6	F. Monsieur	[1]
7	A. Szewczyk	[1]