| |
| 2005 | ||
|---|---|---|
| 3 | EE | C. Petit, A. Meinertzhagen, D. Zander, O. Simonetti, M. Fadlallah, T. Maurel: Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectronics Reliability 45(3-4): 479-485 (2005) |
| 1995 | ||
| 2 | T. Maurel, R. Bouchakour, Christophe Lallement: One-Dimensional Model of the Power Bipolar Transistor with Thermoelectrical Interactions for Circuit Applications. ISCAS 1995: 1860-1863 | |
| 1994 | ||
| 1 | Christophe Lallement, R. Bouchakour, T. Maurel: A VDMOS transistor model taking into account the thermoelectrical interactions. ISCAS 1994: 327-330 | |
| 1 | R. Bouchakour | [1] [2] |
| 2 | M. Fadlallah | [3] |
| 3 | Christophe Lallement | [1] [2] |
| 4 | A. Meinertzhagen | [3] |
| 5 | C. Petit | [3] |
| 6 | O. Simonetti | [3] |
| 7 | D. Zander | [3] |