B. Cretu

2002
2	EE	B. Cretu, F. Balestra, G. Ghibaudo, G. Guégan: Origin of hot carrier degradation in advanced nMOSFET devices. Microelectronics Reliability 42(9-11): 1405-1408 (2002)
2001
1		M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, J. Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)

Coauthor Index

1	F. Balestra	[2]
2	T. Devoivre	[1]
3	M. Fadlallah	[1]
4	G. Ghibaudo	[1] [2]
5	C. Giannakopoulos	[1]
6	G. Guégan	[2]
7	J. Jomaah	[1]
8	F. Monsieur	[1]
9	A. Szewczyk	[1]