T. Devoivre

2002
2	EE	T. Devoivre, M. Lunenborg, C. Julien, J.-P. Carrere, P. Ferreira, W. J. Toren, A. VandeGoor, P. Gayet, T. Berger, O. Hinsinger, P. Vannier, Y. Trouiller, Y. Rody, P.-J. Goirand, R. Palla, I. Thomas, F. Guyader, D. Roy, B. Borot, N. Planes, S. Naudet, F. Pico, D. Duca, F. Lalanne, D. Heslinga, M. Haond: Validated 90nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC). MTDT 2002: 157-162
2001
1		M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, J. Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)

Coauthor Index

1	T. Berger	[2]
2	B. Borot	[2]
3	J.-P. Carrere	[2]
4	B. Cretu	[1]
5	D. Duca	[2]
6	M. Fadlallah	[1]
7	P. Ferreira	[2]
8	P. Gayet	[2]
9	G. Ghibaudo	[1]
10	C. Giannakopoulos	[1]
11	P.-J. Goirand	[2]
12	F. Guyader	[2]
13	M. Haond	[2]
14	D. Heslinga	[2]
15	O. Hinsinger	[2]
16	J. Jomaah	[1]
17	C. Julien	[2]
18	F. Lalanne	[2]
19	M. Lunenborg	[2]
20	F. Monsieur	[1]
21	S. Naudet	[2]
22	R. Palla	[2]
23	F. Pico	[2]
24	N. Planes	[2]
25	Y. Rody	[2]
26	D. Roy	[2]
27	A. Szewczyk	[1]
28	I. Thomas	[2]
29	W. J. Toren	[2]
30	Y. Trouiller	[2]
31	A. VandeGoor	[2]
32	P. Vannier	[2]