F. Guyader

2003
2	EE	M. Fadlallah, C. Petit, A. Meinertzhagen, G. Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader: Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectronics Reliability 43(9-11): 1433-1438 (2003)
2002
1	EE	T. Devoivre, M. Lunenborg, C. Julien, J.-P. Carrere, P. Ferreira, W. J. Toren, A. VandeGoor, P. Gayet, T. Berger, O. Hinsinger, P. Vannier, Y. Trouiller, Y. Rody, P.-J. Goirand, R. Palla, I. Thomas, F. Guyader, D. Roy, B. Borot, N. Planes, S. Naudet, F. Pico, D. Duca, F. Lalanne, D. Heslinga, M. Haond: Validated 90nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC). MTDT 2002: 157-162

Coauthor Index

1	T. Berger	[1]
2	M. Bidaud	[2]
3	B. Borot	[1]
4	J.-P. Carrere	[1]
5	T. Devoivre	[1]
6	D. Duca	[1]
7	M. Fadlallah	[2]
8	P. Ferreira	[1]
9	P. Gayet	[1]
10	G. Ghibaudo	[2]
11	P.-J. Goirand	[1]
12	M. Haond	[1]
13	D. Heslinga	[1]
14	O. Hinsinger	[1]
15	C. Julien	[1]
16	F. Lalanne	[1]
17	M. Lunenborg	[1]
18	A. Meinertzhagen	[2]
19	S. Naudet	[1]
20	R. Palla	[1]
21	C. Petit	[2]
22	F. Pico	[1]
23	N. Planes	[1]
24	Y. Rody	[1]
25	D. Roy	[1]
26	O. Simonetti	[2]
27	I. Thomas	[1]
28	W. J. Toren	[1]
29	Y. Trouiller	[1]
30	A. VandeGoor	[1]
31	P. Vannier	[1]