M. Zoaeter

2007
2	EE	M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter: Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. Microelectronics Journal 38(6-7): 727-734 (2007)
2002
1	EE	M. Fadlallah, G. Ghibaudo, J. Jomaah, M. Zoaeter, G. Guégan: Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectronics Reliability 42(1): 41-46 (2002)

Coauthor Index

1	M. Alwan	[2]
2	B. Beydoun	[2]
3	M. Fadlallah	[1]
4	G. Ghibaudo	[1]
5	G. Guégan	[1]
6	J. Jomaah	[1]
7	K. Ketata	[2]

Colors in the list of coauthors