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2005 | ||
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2 | EE | C. Petit, A. Meinertzhagen, D. Zander, O. Simonetti, M. Fadlallah, T. Maurel: Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectronics Reliability 45(3-4): 479-485 (2005) |
2003 | ||
1 | EE | M. Fadlallah, C. Petit, A. Meinertzhagen, G. Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader: Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectronics Reliability 43(9-11): 1433-1438 (2003) |
1 | M. Bidaud | [1] |
2 | M. Fadlallah | [1] [2] |
3 | G. Ghibaudo | [1] |
4 | F. Guyader | [1] |
5 | T. Maurel | [2] |
6 | A. Meinertzhagen | [1] [2] |
7 | C. Petit | [1] [2] |
8 | D. Zander | [2] |