| |
| 2003 | ||
|---|---|---|
| 1 | EE | M. Fadlallah, C. Petit, A. Meinertzhagen, G. Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader: Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectronics Reliability 43(9-11): 1433-1438 (2003) |
| 1 | M. Fadlallah | [1] |
| 2 | G. Ghibaudo | [1] |
| 3 | F. Guyader | [1] |
| 4 | A. Meinertzhagen | [1] |
| 5 | C. Petit | [1] |
| 6 | O. Simonetti | [1] |