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2003 | ||
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1 | EE | M. Fadlallah, C. Petit, A. Meinertzhagen, G. Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader: Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectronics Reliability 43(9-11): 1433-1438 (2003) |
1 | M. Fadlallah | [1] |
2 | G. Ghibaudo | [1] |
3 | F. Guyader | [1] |
4 | A. Meinertzhagen | [1] |
5 | C. Petit | [1] |
6 | O. Simonetti | [1] |