| |
| 2002 | ||
|---|---|---|
| 3 | EE | M. Fadlallah, G. Ghibaudo, J. Jomaah, M. Zoaeter, G. Guégan: Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectronics Reliability 42(1): 41-46 (2002) |
| 2 | EE | B. Cretu, F. Balestra, G. Ghibaudo, G. Guégan: Origin of hot carrier degradation in advanced nMOSFET devices. Microelectronics Reliability 42(9-11): 1405-1408 (2002) |
| 2001 | ||
| 1 | F. Lime, G. Ghibaudo, G. Guégan: Stress induced leakage current at low field in ultra thin oxides. Microelectronics Reliability 41(9-10): 1421-1425 (2001) | |
| 1 | F. Balestra | [2] |
| 2 | B. Cretu | [2] |
| 3 | M. Fadlallah | [3] |
| 4 | G. Ghibaudo | [1] [2] [3] |
| 5 | J. Jomaah | [3] |
| 6 | F. Lime | [1] |
| 7 | M. Zoaeter | [3] |