| 2005 |
|---|
| 4 | EE | Sreejit Chakravarty,
Yi-Shing Chang,
Hiep Hoang,
Sridhar Jayaraman,
Silvio Picano,
Cheryl Prunty,
Eric W. Savage,
Rehan Sheikh,
Eric N. Tran,
Khen Wee:
Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor.
VTS 2005: 337-342 |
| 2004 |
|---|
| 3 | EE | Sreejit Chakravarty,
Eric W. Savage,
Eric N. Tran:
Defect Coverage Analysis of Partitioned Testing.
ITC 2004: 907-915 |
| 2002 |
|---|
| 2 | EE | Sreejit Chakravarty,
Ankur Jain,
Nandakumar Radhakrishnan,
Eric W. Savage,
Sujit T. Zachariah:
Experimental Evaluation of Scan Tests for Bridges.
ITC 2002: 509-518 |
| 1 | EE | Sreejit Chakravarty,
Kambiz Komeyli,
Eric W. Savage,
Michael J. Carruthers,
Bret T. Stastny,
Sujit T. Zachariah:
Layout Analysis to Extract Open Nets Caused by Systematic Failure Mechanisms.
VTS 2002: 367-372 |
