| 2005 |
|---|
| 3 | EE | Sreejit Chakravarty,
Yi-Shing Chang,
Hiep Hoang,
Sridhar Jayaraman,
Silvio Picano,
Cheryl Prunty,
Eric W. Savage,
Rehan Sheikh,
Eric N. Tran,
Khen Wee:
Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor.
VTS 2005: 337-342 |
| 1998 |
|---|
| 2 | EE | Wayne M. Needham,
Cheryl Prunty,
Yeoh Eng Hong:
High volume microprocessor test escapes, an analysis of defects our tests are missing.
ITC 1998: 25-34 |
| 1 | EE | T. M. Mak,
Debika Bhattacharya,
Cheryl Prunty,
Bob Roeder,
Nermine Ramadan,
Joel Ferguson,
Jianlin Yu:
Cache RAM inductive fault analysis with fab defect modeling.
ITC 1998: 862-871 |
