| |
| 2001 | ||
|---|---|---|
| 1 | EE | Michael Schenkel, Paul Pfäffli, Wolfgang Wilkening, D. Aemmer, Wolfgang Fichtner: Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation. Microelectronics Reliability 41(6): 815-822 (2001) |
| 1 | D. Aemmer | [1] |
| 2 | Wolfgang Fichtner | [1] |
| 3 | Michael Schenkel | [1] |
| 4 | Wolfgang Wilkening | [1] |