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K. Reynders

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2005
1EEWolfgang Stadler, K. Esmark, K. Reynders, M. Zubeidat, M. Graf, Wolfgang Wilkening, J. Willemen, N. Qu, S. Mettler, M. Etherton: Test circuits for fast and reliable assessment of CDM robustness of I/O stages. Microelectronics Reliability 45(2): 269-277 (2005)

Coauthor Index

1K. Esmark [1]
2M. Etherton [1]
3M. Graf [1]
4S. Mettler [1]
5N. Qu [1]
6Wolfgang Stadler [1]
7Wolfgang Wilkening [1]
8J. Willemen [1]
9M. Zubeidat [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)