| |
| 2005 | ||
|---|---|---|
| 1 | EE | Wolfgang Stadler, K. Esmark, K. Reynders, M. Zubeidat, M. Graf, Wolfgang Wilkening, J. Willemen, N. Qu, S. Mettler, M. Etherton: Test circuits for fast and reliable assessment of CDM robustness of I/O stages. Microelectronics Reliability 45(2): 269-277 (2005) |
| 1 | K. Esmark | [1] |
| 2 | M. Etherton | [1] |
| 3 | M. Graf | [1] |
| 4 | S. Mettler | [1] |
| 5 | N. Qu | [1] |
| 6 | K. Reynders | [1] |
| 7 | Wolfgang Stadler | [1] |
| 8 | Wolfgang Wilkening | [1] |
| 9 | J. Willemen | [1] |