| 2006 |
|---|
| 2 | EE | M. Etherton,
N. Qu,
J. Willemen,
Wolfgang Wilkening,
S. Mettler,
M. Dissegna,
R. Stella,
L. Zullino,
A. Andreini,
Horst A. Gieser:
Study of CDM specific effects for a smart power input protection structure.
Microelectronics Reliability 46(5-6): 666-676 (2006) |
| 2005 |
|---|
| 1 | EE | Wolfgang Stadler,
K. Esmark,
K. Reynders,
M. Zubeidat,
M. Graf,
Wolfgang Wilkening,
J. Willemen,
N. Qu,
S. Mettler,
M. Etherton:
Test circuits for fast and reliable assessment of CDM robustness of I/O stages.
Microelectronics Reliability 45(2): 269-277 (2005) |
