2008 |
16 | EE | Alejandro Millán,
Jorge Juan,
Manuel J. Bellido,
David Guerrero,
Paulino Ruiz-de-Clavijo,
Julian Viejo:
Power Dissipation Associated to Internal Effect Transitions in Static CMOS Gates.
PATMOS 2008: 389-398 |
2007 |
15 | EE | David Guerrero,
Alejandro Millán,
Jorge Juan-Chico,
Manuel J. Bellido,
Paulino Ruiz-de-Clavijo,
Enrique Ostúa,
Julian Viejo:
Static Power Consumption in CMOS Gates Using Independent Bodies.
PATMOS 2007: 404-412 |
14 | EE | Julian Viejo,
Alejandro Millán,
Manuel J. Bellido,
Jorge Juan,
Paulino Ruiz-de-Clavijo,
David Guerrero,
Enrique Ostúa,
A. Munoz:
Design of a FFT/IFFT module as an IP core suitable for embedded systems.
SIES 2007: 337-340 |
13 | EE | David Guerrero,
Alejandro Millán,
Jorge Juan-Chico,
Manuel Jesús Bellido Díaz,
Paulino Ruiz-de-Clavijo,
Enrique Ostúa,
Julian Viejo:
Improving the Performance of Static CMOS Gates by Using Independent Bodies.
J. Low Power Electronics 3(1): 70-77 (2007) |
2006 |
12 | EE | Paulino Ruiz-de-Clavijo,
Jorge Juan-Chico,
Manuel Jesús Bellido Díaz,
Alejandro Millán,
David Guerrero,
Enrique Ostúa,
Julian Viejo:
Accurate Logic-Level Current Estimation for Digital CMOS Circuits.
J. Low Power Electronics 2(1): 87-94 (2006) |
2005 |
11 | EE | Alejandro Millán Calderón,
Manuel Jesús Bellido Díaz,
Jorge Juan-Chico,
Paulino Ruiz-de-Clavijo,
David Guerrero Martos,
Enrique Ostúa,
Julian Viejo:
Application of Internode Model to Global Power Consumption Estimation in SCMOS Gates.
PATMOS 2005: 337-347 |
10 | EE | Paulino Ruiz-de-Clavijo,
Jorge Juan-Chico,
Manuel Jesús Bellido Díaz,
Alejandro Millán Calderón,
David Guerrero Martos,
Enrique Ostúa,
Julian Viejo:
Logic-Level Fast Current Simulation for Digital CMOS Circuits.
PATMOS 2005: 425-435 |
2004 |
9 | EE | Alejandro Millán,
Jorge Juan-Chico,
Manuel J. Bellido,
Paulino Ruiz-de-Clavijo,
David Guerrero,
Enrique Ostúa:
Signal Sampling Based Transition Modeling for Digital Gates Characterization.
PATMOS 2004: 829-837 |
2003 |
8 | EE | Alejandro Millán,
Manuel J. Bellido,
Jorge Juan-Chico,
David Guerrero,
Paulino Ruiz-de-Clavijo,
Enrique Ostúa:
Internode: Internal Node Logic Computational Model.
Annual Simulation Symposium 2003: 241-248 |
7 | EE | David Guerrero,
Gustavo Wilke,
José Luís Almada Güntzel,
Manuel J. Bellido,
Jorge Juan-Chico,
Paulino Ruiz-de-Clavijo,
Alejandro Millán:
Computational Delay Models to Estimate the Delay of Floating Cubes in CMOS Circuits.
PATMOS 2003: 501-510 |
2002 |
6 | EE | C. Baena,
Jorge Juan-Chico,
Manuel J. Bellido,
Paulino Ruiz-de-Clavijo,
Carlos J. Jiménez,
Manuel Valencia:
Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level.
PATMOS 2002: 353-362 |
5 | EE | Paulino Ruiz-de-Clavijo,
Jorge Juan-Chico,
Manuel J. Bellido,
Alejandro Millán,
David Guerrero:
Efficient and Fast Current Curve Estimation of CMOS Digital Circuits at the Logic Level.
PATMOS 2002: 400-408 |
4 | EE | Alejandro Millán,
Jorge Juan-Chico,
Manuel J. Bellido,
Paulino Ruiz-de-Clavijo,
David Guerrero:
Characterization of Normal Propagation Delay for Delay Degradation Model (DDM).
PATMOS 2002: 477-486 |
2001 |
3 | EE | Paulino Ruiz-de-Clavijo,
Jorge Juan-Chico,
Manuel J. Bellido,
Antonio J. Acosta,
Manuel Valencia:
HALOTIS: high accuracy LOgic TIming simulator with inertial and degradation delay model.
DATE 2001: 467-471 |
2 | EE | Manuel J. Bellido,
Jorge Juan-Chico,
Paulino Ruiz-de-Clavijo,
Antonio J. Acosta,
Manuel Valencia:
Gate-level simulation of CMOS circuits using the IDDM model.
ISCAS (5) 2001: 483-486 |
2000 |
1 | EE | Jorge Juan-Chico,
Manuel J. Bellido,
Paulino Ruiz-de-Clavijo,
Antonio J. Acosta,
Manuel Valencia:
Degradation Delay Model Extension to CMOS Gates.
PATMOS 2000: 149-158 |