M. Rüffer
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1999
1
EE
Dirk Niggemeyer
, M. Rüffer: Parametric Built-In Self-Test of VLSI Systems.
DATE 1999
: 376-
Coauthor
Index
1
Dirk Niggemeyer
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
