1998 | ||
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2 | EE | Petra Nordholz, Hartmut Grabinski, Dieter Treytnar, Jan Otterstedt, Dirk Niggemeyer, Uwe Arz, T. W. Williams: Core Interconnect Testing Hazards. DATE 1998: 953-954 |
1 | EE | Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams: Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. VTS 1998: 28-33 |
1 | Uwe Arz | [2] |
2 | Hartmut Grabinski | [1] [2] |
3 | Dirk Niggemeyer | [1] [2] |
4 | Jan Otterstedt | [1] [2] |
5 | Dieter Treytnar | [1] [2] |
6 | T. W. Williams | [1] [2] |