Timothy J. Bergfeld
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2000
1
EE
Timothy J. Bergfeld,
Dirk Niggemeyer
,
Elizabeth M. Rudnick
: Diagnostic Testing of Embedded Memories Using BIST.
DATE 2000
: 305-
Coauthor
Index
1
Dirk Niggemeyer
[
1
]
2
Elizabeth M. Rudnick
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
