![]() |
| 1998 | ||
|---|---|---|
| 2 | EE | Petra Nordholz, Hartmut Grabinski, Dieter Treytnar, Jan Otterstedt, Dirk Niggemeyer, Uwe Arz, T. W. Williams: Core Interconnect Testing Hazards. DATE 1998: 953-954 |
| 1 | EE | Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams: Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. VTS 1998: 28-33 |
| 1 | Uwe Arz | [2] |
| 2 | Dirk Niggemeyer | [1] [2] |
| 3 | Petra Nordholz | [1] [2] |
| 4 | Jan Otterstedt | [1] [2] |
| 5 | Dieter Treytnar | [1] [2] |
| 6 | T. W. Williams | [1] [2] |