2006 |
4 | EE | Mark B. Ketchen,
Manjul Bhushan:
Product-representative 'at speed' test structures for CMOS characterization.
IBM Journal of Research and Development 50(4-5): 451-468 (2006) |
2003 |
3 | EE | Stephen V. Kosonocky,
Azeez J. Bhavnagarwala,
Kenneth Chin,
George Gristede,
Anne-Marie Haen,
Wei Hwang,
Mark B. Ketchen,
Suhwan Kim,
Daniel R. Knebel,
Kevin W. Warren,
Victor V. Zyuban:
Low-power circuits and technology for wireless digital systems.
IBM Journal of Research and Development 47(2-3): 283-298 (2003) |
2002 |
2 | EE | Franco Stellari,
Peilin Song,
James C. Tsang,
Moyra K. McManus,
Mark B. Ketchen:
Optical diagnosis of excess IDDQ in low power CMOS circuits.
Microelectronics Reliability 42(9-11): 1689-1694 (2002) |
1995 |
1 | EE | John R. Kirtley,
Mark B. Ketchen,
Chang C. Tsuei,
Jonathan Z. Sun,
William J. Gallagher,
Lock See Yu-Jahnes,
Arunava Gupta,
Kevin G. Stawiasz,
Shalom J. Wind:
Design and applications of a scanning SQUID microscope.
IBM Journal of Research and Development 39(6): 655-668 (1995) |