2007 |
14 | EE | Georges G. E. Gielen,
Wim Dehaene,
Phillip Christie,
Dieter Draxelmayr,
Edmond Janssens,
Karen Maex,
Ted Vucurevich:
Analog and Digital Circuit Design in 65 nm CMOS: End of the Road?
CoRR abs/0710.4709: (2007) |
2006 |
13 | EE | Evelyn Grossar,
Michele Stucchi,
Karen Maex,
Wim Dehaene:
Statistically Aware SRAM Memory Array Design.
ISQED 2006: 25-30 |
12 | EE | Mandeep Bamal,
Youssef Travaly,
Wenqi Zhang,
Michele Stucchi,
Karen Maex:
Impact of interconnect resistance increase on system performance of low power and high performance designs.
SLIP 2006: 85-90 |
2005 |
11 | EE | Georges G. E. Gielen,
Wim Dehaene,
Phillip Christie,
Dieter Draxelmayr,
Edmond Janssens,
Karen Maex,
Ted Vucurevich:
Analog and Digital Circuit Design in 65 nm CMOS: End of the Road?
DATE 2005: 36-42 |
10 | EE | Hua Wang,
Miguel Miranda,
Wim Dehaene,
Francky Catthoor,
Karen Maex:
Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules.
DATE 2005: 914-919 |
9 | EE | Y.-L. Li,
Zs. Tökei,
Ph. Roussel,
Guido Groeseneken,
Karen Maex:
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability.
Microelectronics Reliability 45(9-11): 1299-1304 (2005) |
2004 |
8 | EE | Francky Catthoor,
Andrea Cuomo,
Grant Martin,
Patrick Groeneveld,
Rudy Lauwereins,
Karen Maex,
Patrick van de Steeg,
Ron Wilson:
How Can System-Level Design Solve the Interconnect Technology Scaling Problem?
DATE 2004: 332-339 |
7 | EE | Mandeep Bamal,
Evelyn Grossar,
Michele Stucchi,
Karen Maex:
Interconnect width selection for deep submicron designs using the table lookup method.
SLIP 2004: 41-44 |
2003 |
6 | EE | Antonis Papanikolaou,
Miguel Miranda,
Francky Catthoor,
Henk Corporaal,
Hugo De Man,
David De Roest,
Michele Stucchi,
Karen Maex:
Global interconnect trade-off for technology over memory modules to application level: case study.
SLIP 2003: 125-132 |
2002 |
5 | EE | Hasan Ymeri,
Bart Nauwelaers,
Karen Maex,
David De Roest,
Michele Stucchi,
Servaas Vandenberghe:
Simple and Efficient Approach for Shunt Admittance Parameters Calculations of VLSI On-Chip Interconnects on Semiconducting Substrate.
DATE 2002: 1113 |
4 | EE | Antonis Papanikolaou,
Miguel Miranda,
Francky Catthoor,
Henk Corporaal,
Hugo De Man,
David De Roest,
Michele Stucchi,
Karen Maex:
Interconnect exploration for future wire dominated technologies.
SLIP 2002: 105-106 |
3 | EE | Hasan Ymeri,
Bart Nauwelaers,
Karen Maex,
Servaas Vandenberghe,
David De Roest:
A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate.
Microprocessors and Microsystems 26(1): 45-48 (2002) |
2001 |
2 | EE | Hasan Ymeri,
Bart Nauwelaers,
Karen Maex:
Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate.
Integration 30(2): 133-141 (2001) |
2000 |
1 | EE | Hasan Ymeri,
Bart Nauwelaers,
Karen Maex:
Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method.
Integration 30(1): 55-63 (2000) |