| |
| 2005 | ||
|---|---|---|
| 1 | EE | Y.-L. Li, Zs. Tökei, Ph. Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005) |
| 1 | Guido Groeseneken | [1] |
| 2 | Y.-L. Li | [1] |
| 3 | Karen Maex | [1] |
| 4 | Zs. Tökei | [1] |