Y.-L. Li

List of publications from the DBLP Bibliography Server - FAQ

2005

2 EE Y.-L. Li, Zs. Tökei, Ph. Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005)

1 EE Zs. Tökei, Y.-L. Li, G. P. Beyer: Reliability challenges for copper low-k dielectrics and copper diffusion barriers. Microelectronics Reliability 45(9-11): 1436-1442 (2005)

2005
2	EE	Y.-L. Li, Zs. Tökei, Ph. Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005)
1	EE	Zs. Tökei, Y.-L. Li, G. P. Beyer: Reliability challenges for copper low-k dielectrics and copper diffusion barriers. Microelectronics Reliability 45(9-11): 1436-1442 (2005)

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