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2007 | ||
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2 | EE | M. Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Begueret: A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications. J. Electronic Testing 23(6): 593-603 (2007) |
2006 | ||
1 | EE | M. Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Begueret: A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications. European Test Symposium 2006: 151-158 |
1 | Jean-Baptiste Begueret | [1] [2] |
2 | Yann Deval | [1] [2] |
3 | Hervé Lapuyade | [1] [2] |
4 | M. De Matos | [1] [2] |
5 | Thierry Taris | [1] [2] |