| |
| 2003 | ||
|---|---|---|
| 1 | EE | F. Darracq, Hervé Lapuyade, N. Buard, P. Fouillat, R. Dufayel, T. Carriere: Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectronics Reliability 43(9-11): 1615-1619 (2003) |
| 1 | N. Buard | [1] |
| 2 | T. Carriere | [1] |
| 3 | F. Darracq | [1] |
| 4 | P. Fouillat | [1] |
| 5 | Hervé Lapuyade | [1] |