| 2007 |
|---|
| 3 | EE | M. Cimino,
Hervé Lapuyade,
M. De Matos,
Thierry Taris,
Yann Deval,
Jean-Baptiste Begueret:
A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications.
J. Electronic Testing 23(6): 593-603 (2007) |
| 2006 |
|---|
| 2 | EE | M. Cimino,
Hervé Lapuyade,
M. De Matos,
Thierry Taris,
Yann Deval,
Jean-Baptiste Begueret:
A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications.
European Test Symposium 2006: 151-158 |
| 1 | EE | Thierry Taris,
Jean-Baptiste Begueret,
Hervé Lapuyade,
Yann Deval:
RF CMOS body-effect circuits.
Microelectronics Journal 37(11): 1251-1260 (2006) |
