| 2006 |
|---|
| 4 | EE | Masahide Miyazaki,
Tomokazu Yoneda,
Hideo Fujiwara:
A memory grouping method for sharing memory BIST logic.
ASP-DAC 2006: 671-676 |
| 3 | EE | Masahide Miyazaki,
Tomokazu Yoneda,
Hideo Fujiwara:
A Memory Grouping Method for Reducing Memory BIST Logic of System-on-Chips.
IEICE Transactions 89-D(4): 1490-1497 (2006) |
| 2003 |
|---|
| 2 | EE | Toshinori Hosokawa,
Hiroshi Date,
Masahide Miyazaki,
Michiaki Muraoka,
Hideo Fujiwara:
A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint.
Asian Test Symposium 2003: 130-135 |
| 1 | EE | Masahide Miyazaki,
Toshinori Hosokawa,
Hiroshi Date,
Michiaki Muraoka,
Hideo Fujiwara:
A DFT Selection Method for Reducing Test Application Time of System-on-Chips.
Asian Test Symposium 2003: 412-417 |
