2006 |
13 | EE | Chuanzhao Yu,
J. S. Yuan,
Enjun Xiao:
Dynamic voltage stress effects on nMOS varactor.
Microelectronics Reliability 46(9-11): 1812-1816 (2006) |
12 | EE | C. Yu,
L. Jiang,
J. S. Yuan:
Study of performance degradations in DC-DC converter due to hot carrier stress by simulation.
Microelectronics Reliability 46(9-11): 1840-1843 (2006) |
2005 |
11 | EE | Chuanzhao Yu,
Hong Yang,
Enjun Xiao,
J. S. Yuan:
Voltage stress-induced performance degradation in NMOSFET mixer.
IEICE Electronic Express 2(5): 133-137 (2005) |
10 | EE | Enjun Xiao,
P. P. Ghosh,
C. Yu,
J. S. Yuan:
Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications.
Microelectronics Reliability 45(9-11): 1382-1385 (2005) |
9 | EE | Chuanzhao Yu,
Enjun Xiao,
J. S. Yuan:
Voltage stress-induced hot carrier effects on SiGe HBT VCO.
Microelectronics Reliability 45(9-11): 1402-1405 (2005) |
8 | EE | Chuanzhao Yu,
J. S. Yuan,
Anwar Sadat:
Dynamic stress-induced high-frequency noise degradations in nMOSFETs.
Microelectronics Reliability 45(9-11): 1794-1799 (2005) |
2003 |
7 | EE | Li Yang,
J. S. Yuan:
A decoupling technique for CMOS strong-coupled structures.
ACM Great Lakes Symposium on VLSI 2003: 128-131 |
6 | EE | Li Yang,
J. S. Yuan:
Design of enhancement current-balanced logic for mixed-signal ICs.
ISCAS (1) 2003: 761-764 |
5 | EE | Li Yang,
J. S. Yuan:
Analyzing Internal-Switching Induced Simultaneous Switching Noise.
ISQED 2003: 410- |
4 | EE | W. Kuang,
J. S. Yuan,
Abdel Ejnioui:
Supply Voltage Scalable System Design Using Self-Timed Circuits.
ISVLSI 2003: 161-166 |
3 | EE | Li Yang,
J. S. Yuan:
Enhanced Techniques for Current Balanced Logic in Mixed-Signal ICs.
ISVLSI 2003: 278-279 |
2 | EE | W. Kuang,
J. S. Yuan:
An Adaptive Supply-Voltage Scheme for Low Power Self-Timed CMOS Digital Design.
VLSI Design 2003: 315-319 |
2001 |
1 | EE | Wei Li,
Qiang Li,
J. S. Yuan,
Joshua McConkey,
Yuan Chen,
Sundar Chetlur,
Jonathan Zhou,
A. S. Oates:
Hot-carrier-Induced Circuit Degradation for 0.18 ?m CMOS Technology.
ISQED 2001: 284-289 |