| |
| 2006 | ||
|---|---|---|
| 4 | EE | Chuanzhao Yu, J. S. Yuan, Enjun Xiao: Dynamic voltage stress effects on nMOS varactor. Microelectronics Reliability 46(9-11): 1812-1816 (2006) |
| 2005 | ||
| 3 | EE | Chuanzhao Yu, Hong Yang, Enjun Xiao, J. S. Yuan: Voltage stress-induced performance degradation in NMOSFET mixer. IEICE Electronic Express 2(5): 133-137 (2005) |
| 2 | EE | Chuanzhao Yu, Enjun Xiao, J. S. Yuan: Voltage stress-induced hot carrier effects on SiGe HBT VCO. Microelectronics Reliability 45(9-11): 1402-1405 (2005) |
| 1 | EE | Chuanzhao Yu, J. S. Yuan, Anwar Sadat: Dynamic stress-induced high-frequency noise degradations in nMOSFETs. Microelectronics Reliability 45(9-11): 1794-1799 (2005) |
| 1 | Anwar Sadat | [1] |
| 2 | Enjun Xiao | [2] [3] [4] |
| 3 | Hong Yang | [3] |
| 4 | J. S. Yuan | [1] [2] [3] [4] |