| |
| 2001 | ||
|---|---|---|
| 1 | EE | Wei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates: Hot-carrier-Induced Circuit Degradation for 0.18 ?m CMOS Technology. ISQED 2001: 284-289 |
| 1 | Yuan Chen | [1] |
| 2 | Qiang Li | [1] |
| 3 | Wei Li | [1] |
| 4 | Joshua McConkey | [1] |
| 5 | A. S. Oates | [1] |
| 6 | J. S. Yuan | [1] |
| 7 | Jonathan Zhou | [1] |