P. P. Ghosh
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2005
1
EE
Enjun Xiao
, P. P. Ghosh,
C. Yu
,
J. S. Yuan
: Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications.
Microelectronics Reliability 45
(9-11): 1382-1385 (2005)
Coauthor
Index
1
Enjun Xiao
[
1
]
2
C. Yu
[
1
]
3
J. S. Yuan
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)