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Jonathan Zhou

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2001
1EEWei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates: Hot-carrier-Induced Circuit Degradation for 0.18 ?m CMOS Technology. ISQED 2001: 284-289

Coauthor Index

1Yuan Chen [1]
2Sundar Chetlur [1]
3Qiang Li [1]
4Wei Li [1]
5Joshua McConkey [1]
6A. S. Oates [1]
7J. S. Yuan [1]

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