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Anwar Sadat

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2005
1EEChuanzhao Yu, J. S. Yuan, Anwar Sadat: Dynamic stress-induced high-frequency noise degradations in nMOSFETs. Microelectronics Reliability 45(9-11): 1794-1799 (2005)

Coauthor Index

1Chuanzhao Yu [1]
2J. S. Yuan [1]

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