| 2006 |
|---|
| 4 | EE | Chuanzhao Yu,
J. S. Yuan,
Enjun Xiao:
Dynamic voltage stress effects on nMOS varactor.
Microelectronics Reliability 46(9-11): 1812-1816 (2006) |
| 2005 |
|---|
| 3 | EE | Chuanzhao Yu,
Hong Yang,
Enjun Xiao,
J. S. Yuan:
Voltage stress-induced performance degradation in NMOSFET mixer.
IEICE Electronic Express 2(5): 133-137 (2005) |
| 2 | EE | Enjun Xiao,
P. P. Ghosh,
C. Yu,
J. S. Yuan:
Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications.
Microelectronics Reliability 45(9-11): 1382-1385 (2005) |
| 1 | EE | Chuanzhao Yu,
Enjun Xiao,
J. S. Yuan:
Voltage stress-induced hot carrier effects on SiGe HBT VCO.
Microelectronics Reliability 45(9-11): 1402-1405 (2005) |
