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Haruhiko Abe

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1996
1 Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe: A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC 1996: 319-324

Coauthor Index

1Mitsuhiro Hamada [1]
2Shinji Komori [1]
3Kazuo Kyuma [1]
4Fumihiro Okuda [1]
5Narumi Sakashita [1]
6Hiroki Shimano [1]
7Ken'ichi Shimomura [1]
8Tetsuo Tada [1]
9Akihiko Yasuoka [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)