![]() |
| 2000 | ||
|---|---|---|
| 2 | Tomoya Kawagoe, Jun Ohtani, Mitsutaka Niiro, Tukasa Ooishi, Mitsuhiro Hamada, Hideto Hidaka: A built-in self-repair analyzer (CRESTA) for embedded DRAMs. ITC 2000: 567-574 | |
| 1996 | ||
| 1 | Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe: A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC 1996: 319-324 | |
| 1 | Haruhiko Abe | [1] |
| 2 | Hideto Hidaka | [2] |
| 3 | Tomoya Kawagoe | [2] |
| 4 | Shinji Komori | [1] |
| 5 | Kazuo Kyuma | [1] |
| 6 | Mitsutaka Niiro | [2] |
| 7 | Jun Ohtani | [2] |
| 8 | Fumihiro Okuda | [1] |
| 9 | Tukasa Ooishi | [2] |
| 10 | Narumi Sakashita | [1] |
| 11 | Hiroki Shimano | [1] |
| 12 | Ken'ichi Shimomura | [1] |
| 13 | Tetsuo Tada | [1] |
| 14 | Akihiko Yasuoka | [1] |