2000 | ||
---|---|---|
2 | Tomoya Kawagoe, Jun Ohtani, Mitsutaka Niiro, Tukasa Ooishi, Mitsuhiro Hamada, Hideto Hidaka: A built-in self-repair analyzer (CRESTA) for embedded DRAMs. ITC 2000: 567-574 | |
1996 | ||
1 | Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe: A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC 1996: 319-324 |
1 | Haruhiko Abe | [1] |
2 | Hideto Hidaka | [2] |
3 | Tomoya Kawagoe | [2] |
4 | Shinji Komori | [1] |
5 | Kazuo Kyuma | [1] |
6 | Mitsutaka Niiro | [2] |
7 | Jun Ohtani | [2] |
8 | Fumihiro Okuda | [1] |
9 | Tukasa Ooishi | [2] |
10 | Narumi Sakashita | [1] |
11 | Hiroki Shimano | [1] |
12 | Ken'ichi Shimomura | [1] |
13 | Tetsuo Tada | [1] |
14 | Akihiko Yasuoka | [1] |