| 2006 |
|---|
| 6 | EE | M. Exarchos,
E. Papandreou,
P. Pons,
M. Lamhamdi,
G. J. Papaioannou,
R. Plana:
Charging of radiation induced defects in RF MEMS dielectric films.
Microelectronics Reliability 46(9-11): 1695-1699 (2006) |
| 5 | EE | M. Lamhamdi,
J. Guastavino,
L. Boudou,
Y. Segui,
P. Pons,
L. Bouscayrol,
R. Plana:
Charging-Effects in RF capacitive switches influence of insulating layers composition.
Microelectronics Reliability 46(9-11): 1700-1704 (2006) |
| 2005 |
|---|
| 4 | EE | K. Yacine,
F. Flourens,
D. Bourrier,
L. Salvagnac,
P. Calmont,
X. Lafontan,
Q.-H. Duong,
L. Buchaillot,
D. Peyrou,
P. Pons:
Biaxial initial stress characterization of bilayer gold RF-switches.
Microelectronics Reliability 45(9-11): 1776-1781 (2005) |
| 3 | EE | M. Exarchos,
V. Theonas,
P. Pons,
G. J. Papaioannou,
S. Mellé,
D. Dubuc,
F. Cocetti,
R. Plana:
Investigation of charging mechanisms in metal-insulator-metal structures.
Microelectronics Reliability 45(9-11): 1782-1785 (2005) |
| 2 | EE | Q.-H. Duong,
L. Buchaillot,
D. Collard,
P. Schmitt,
X. Lafontan,
P. Pons,
F. Flourens,
F. Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches.
Microelectronics Reliability 45(9-11): 1790-1793 (2005) |
| 2004 |
|---|
| 1 | EE | D. Dubuc,
M. Saddaoui,
S. Mellé,
F. Flourens,
L. Rabbia,
B. Ducarouge,
K. Grenier,
P. Pons,
A. Boukabache,
L. Bary:
Smart MEMS concept for high secure RF and millimeterwave communications.
Microelectronics Reliability 44(6): 899-907 (2004) |
