| 2005 |
|---|
| 3 | EE | S. Mellé,
D. De Conto,
L. Mazenq,
D. Dubuc,
B. Poussard,
C. Bordas,
K. Grenier,
L. Bary,
O. Vendier,
J. L. Muraro:
Failure predictive model of capacitive RF-MEMS.
Microelectronics Reliability 45(9-11): 1770-1775 (2005) |
| 2 | EE | M. Exarchos,
V. Theonas,
P. Pons,
G. J. Papaioannou,
S. Mellé,
D. Dubuc,
F. Cocetti,
R. Plana:
Investigation of charging mechanisms in metal-insulator-metal structures.
Microelectronics Reliability 45(9-11): 1782-1785 (2005) |
| 2004 |
|---|
| 1 | EE | D. Dubuc,
M. Saddaoui,
S. Mellé,
F. Flourens,
L. Rabbia,
B. Ducarouge,
K. Grenier,
P. Pons,
A. Boukabache,
L. Bary:
Smart MEMS concept for high secure RF and millimeterwave communications.
Microelectronics Reliability 44(6): 899-907 (2004) |
