| 2006 |
|---|
| 4 | EE | M. Exarchos,
E. Papandreou,
P. Pons,
M. Lamhamdi,
G. J. Papaioannou,
R. Plana:
Charging of radiation induced defects in RF MEMS dielectric films.
Microelectronics Reliability 46(9-11): 1695-1699 (2006) |
| 3 | EE | M. Lamhamdi,
J. Guastavino,
L. Boudou,
Y. Segui,
P. Pons,
L. Bouscayrol,
R. Plana:
Charging-Effects in RF capacitive switches influence of insulating layers composition.
Microelectronics Reliability 46(9-11): 1700-1704 (2006) |
| 2005 |
|---|
| 2 | EE | M. Exarchos,
V. Theonas,
P. Pons,
G. J. Papaioannou,
S. Mellé,
D. Dubuc,
F. Cocetti,
R. Plana:
Investigation of charging mechanisms in metal-insulator-metal structures.
Microelectronics Reliability 45(9-11): 1782-1785 (2005) |
| 2003 |
|---|
| 1 | EE | J. Kuchenbecker,
M. Borgarino,
M. Zeuner,
U. König,
R. Plana,
Fausto Fantini:
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's.
Microelectronics Reliability 43(9-11): 1719-1723 (2003) |
