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E. Papandreou

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2006
1EEM. Exarchos, E. Papandreou, P. Pons, M. Lamhamdi, G. J. Papaioannou, R. Plana: Charging of radiation induced defects in RF MEMS dielectric films. Microelectronics Reliability 46(9-11): 1695-1699 (2006)

Coauthor Index

1M. Exarchos [1]
2M. Lamhamdi [1]
3G. J. Papaioannou [1]
4R. Plana [1]
5P. Pons [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)