| |
| 2006 | ||
|---|---|---|
| 1 | EE | M. Exarchos, E. Papandreou, P. Pons, M. Lamhamdi, G. J. Papaioannou, R. Plana: Charging of radiation induced defects in RF MEMS dielectric films. Microelectronics Reliability 46(9-11): 1695-1699 (2006) |
| 1 | M. Exarchos | [1] |
| 2 | M. Lamhamdi | [1] |
| 3 | G. J. Papaioannou | [1] |
| 4 | R. Plana | [1] |
| 5 | P. Pons | [1] |