| 2006 |
|---|
| 3 | EE | M. Exarchos,
E. Papandreou,
P. Pons,
M. Lamhamdi,
G. J. Papaioannou,
R. Plana:
Charging of radiation induced defects in RF MEMS dielectric films.
Microelectronics Reliability 46(9-11): 1695-1699 (2006) |
| 2005 |
|---|
| 2 | EE | M. A. Exarchos,
G. J. Papaioannou,
J. Jomaah,
F. Balestra:
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs.
Microelectronics Reliability 45(9-11): 1386-1389 (2005) |
| 1 | EE | M. Exarchos,
V. Theonas,
P. Pons,
G. J. Papaioannou,
S. Mellé,
D. Dubuc,
F. Cocetti,
R. Plana:
Investigation of charging mechanisms in metal-insulator-metal structures.
Microelectronics Reliability 45(9-11): 1782-1785 (2005) |
