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K. Grenier

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2005
2EES. Mellé, D. De Conto, L. Mazenq, D. Dubuc, B. Poussard, C. Bordas, K. Grenier, L. Bary, O. Vendier, J. L. Muraro: Failure predictive model of capacitive RF-MEMS. Microelectronics Reliability 45(9-11): 1770-1775 (2005)
2004
1EED. Dubuc, M. Saddaoui, S. Mellé, F. Flourens, L. Rabbia, B. Ducarouge, K. Grenier, P. Pons, A. Boukabache, L. Bary: Smart MEMS concept for high secure RF and millimeterwave communications. Microelectronics Reliability 44(6): 899-907 (2004)

Coauthor Index

1L. Bary [1] [2]
2C. Bordas [2]
3A. Boukabache [1]
4D. De Conto [2]
5D. Dubuc [1] [2]
6B. Ducarouge [1]
7F. Flourens [1]
8L. Mazenq [2]
9S. Mellé [1] [2]
10J. L. Muraro [2]
11P. Pons [1]
12B. Poussard [2]
13L. Rabbia [1]
14M. Saddaoui [1]
15O. Vendier [2]

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