| |
| 2005 | ||
|---|---|---|
| 1 | EE | K. Yacine, F. Flourens, D. Bourrier, L. Salvagnac, P. Calmont, X. Lafontan, Q.-H. Duong, L. Buchaillot, D. Peyrou, P. Pons: Biaxial initial stress characterization of bilayer gold RF-switches. Microelectronics Reliability 45(9-11): 1776-1781 (2005) |
| 1 | D. Bourrier | [1] |
| 2 | L. Buchaillot | [1] |
| 3 | Q.-H. Duong | [1] |
| 4 | F. Flourens | [1] |
| 5 | X. Lafontan | [1] |
| 6 | D. Peyrou | [1] |
| 7 | P. Pons | [1] |
| 8 | L. Salvagnac | [1] |
| 9 | K. Yacine | [1] |