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X. Lafontan

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2008
4EEC. Seguineau, M. Ignat, C. Malhaire, S. Brida, X. Lafontan, J.-M. Desmarres, C. Josserond, L. Debove: Micro-tensile tests on micromachined metal on polymer specimens: elasticity, plasticity and rupture CoRR abs/0805.0942: (2008)
2005
3EEK. Yacine, F. Flourens, D. Bourrier, L. Salvagnac, P. Calmont, X. Lafontan, Q.-H. Duong, L. Buchaillot, D. Peyrou, P. Pons: Biaxial initial stress characterization of bilayer gold RF-switches. Microelectronics Reliability 45(9-11): 1776-1781 (2005)
2EEQ.-H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, P. Pons, F. Flourens, F. Pressecq: Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectronics Reliability 45(9-11): 1790-1793 (2005)
2003
1EEX. Lafontan, F. Pressecq, Felix Beaudoin, S. Rigo, M. Dardalhon, J.-L. Roux, P. Schmitt, J. Kuchenbecker, B. Baradat, D. Lellouchi: The advent of MEMS in space. Microelectronics Reliability 43(7): 1061-1083 (2003)

Coauthor Index

1B. Baradat [1]
2Felix Beaudoin [1]
3D. Bourrier [3]
4S. Brida [4]
5L. Buchaillot [2] [3]
6P. Calmont [3]
7D. Collard [2]
8M. Dardalhon [1]
9L. Debove [4]
10J.-M. Desmarres [4]
11Q.-H. Duong [2] [3]
12F. Flourens [2] [3]
13M. Ignat [4]
14C. Josserond [4]
15J. Kuchenbecker [1]
16D. Lellouchi [1]
17C. Malhaire [4]
18D. Peyrou [3]
19P. Pons [2] [3]
20F. Pressecq [1] [2]
21S. Rigo [1]
22J.-L. Roux [1]
23L. Salvagnac [3]
24P. Schmitt [1] [2]
25C. Seguineau [4]
26K. Yacine [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)