2008 |
4 | EE | C. Seguineau,
M. Ignat,
C. Malhaire,
S. Brida,
X. Lafontan,
J.-M. Desmarres,
C. Josserond,
L. Debove:
Micro-tensile tests on micromachined metal on polymer specimens: elasticity, plasticity and rupture
CoRR abs/0805.0942: (2008) |
2005 |
3 | EE | K. Yacine,
F. Flourens,
D. Bourrier,
L. Salvagnac,
P. Calmont,
X. Lafontan,
Q.-H. Duong,
L. Buchaillot,
D. Peyrou,
P. Pons:
Biaxial initial stress characterization of bilayer gold RF-switches.
Microelectronics Reliability 45(9-11): 1776-1781 (2005) |
2 | EE | Q.-H. Duong,
L. Buchaillot,
D. Collard,
P. Schmitt,
X. Lafontan,
P. Pons,
F. Flourens,
F. Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches.
Microelectronics Reliability 45(9-11): 1790-1793 (2005) |
2003 |
1 | EE | X. Lafontan,
F. Pressecq,
Felix Beaudoin,
S. Rigo,
M. Dardalhon,
J.-L. Roux,
P. Schmitt,
J. Kuchenbecker,
B. Baradat,
D. Lellouchi:
The advent of MEMS in space.
Microelectronics Reliability 43(7): 1061-1083 (2003) |