| |
| 2006 | ||
|---|---|---|
| 2 | EE | M. Exarchos, E. Papandreou, P. Pons, M. Lamhamdi, G. J. Papaioannou, R. Plana: Charging of radiation induced defects in RF MEMS dielectric films. Microelectronics Reliability 46(9-11): 1695-1699 (2006) |
| 1 | EE | M. Lamhamdi, J. Guastavino, L. Boudou, Y. Segui, P. Pons, L. Bouscayrol, R. Plana: Charging-Effects in RF capacitive switches influence of insulating layers composition. Microelectronics Reliability 46(9-11): 1700-1704 (2006) |
| 1 | L. Boudou | [1] |
| 2 | L. Bouscayrol | [1] |
| 3 | M. Exarchos | [2] |
| 4 | J. Guastavino | [1] |
| 5 | G. J. Papaioannou | [2] |
| 6 | E. Papandreou | [2] |
| 7 | R. Plana | [1] [2] |
| 8 | P. Pons | [1] [2] |
| 9 | Y. Segui | [1] |