Q.-H. Duong

2005
2	EE	K. Yacine, F. Flourens, D. Bourrier, L. Salvagnac, P. Calmont, X. Lafontan, Q.-H. Duong, L. Buchaillot, D. Peyrou, P. Pons: Biaxial initial stress characterization of bilayer gold RF-switches. Microelectronics Reliability 45(9-11): 1776-1781 (2005)
1	EE	Q.-H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, P. Pons, F. Flourens, F. Pressecq: Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectronics Reliability 45(9-11): 1790-1793 (2005)

Coauthor Index

1	D. Bourrier	[2]
2	L. Buchaillot	[1] [2]
3	P. Calmont	[2]
4	D. Collard	[1]
5	F. Flourens	[1] [2]
6	X. Lafontan	[1] [2]
7	D. Peyrou	[2]
8	P. Pons	[1] [2]
9	F. Pressecq	[1]
10	L. Salvagnac	[2]
11	P. Schmitt	[1]
12	K. Yacine	[2]