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M. Exarchos

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2006
2EEM. Exarchos, E. Papandreou, P. Pons, M. Lamhamdi, G. J. Papaioannou, R. Plana: Charging of radiation induced defects in RF MEMS dielectric films. Microelectronics Reliability 46(9-11): 1695-1699 (2006)
2005
1EEM. Exarchos, V. Theonas, P. Pons, G. J. Papaioannou, S. Mellé, D. Dubuc, F. Cocetti, R. Plana: Investigation of charging mechanisms in metal-insulator-metal structures. Microelectronics Reliability 45(9-11): 1782-1785 (2005)

Coauthor Index

1F. Cocetti [1]
2D. Dubuc [1]
3M. Lamhamdi [2]
4S. Mellé [1]
5G. J. Papaioannou [1] [2]
6E. Papandreou [2]
7R. Plana [1] [2]
8P. Pons [1] [2]
9V. Theonas [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)