| |
| 2006 | ||
|---|---|---|
| 2 | EE | M. Exarchos, E. Papandreou, P. Pons, M. Lamhamdi, G. J. Papaioannou, R. Plana: Charging of radiation induced defects in RF MEMS dielectric films. Microelectronics Reliability 46(9-11): 1695-1699 (2006) |
| 2005 | ||
| 1 | EE | M. Exarchos, V. Theonas, P. Pons, G. J. Papaioannou, S. Mellé, D. Dubuc, F. Cocetti, R. Plana: Investigation of charging mechanisms in metal-insulator-metal structures. Microelectronics Reliability 45(9-11): 1782-1785 (2005) |
| 1 | F. Cocetti | [1] |
| 2 | D. Dubuc | [1] |
| 3 | M. Lamhamdi | [2] |
| 4 | S. Mellé | [1] |
| 5 | G. J. Papaioannou | [1] [2] |
| 6 | E. Papandreou | [2] |
| 7 | R. Plana | [1] [2] |
| 8 | P. Pons | [1] [2] |
| 9 | V. Theonas | [1] |