2007 |
4 | EE | A.-S. Rollier,
M. Faucher,
B. Legrand,
D. Collard,
L. Buchaillot:
Electrostatic Actuators Operating in Liquid Environment : Suppression of Pull-in Instability and Dynamic Response
CoRR abs/0711.3321: (2007) |
2005 |
3 | EE | K. Yacine,
F. Flourens,
D. Bourrier,
L. Salvagnac,
P. Calmont,
X. Lafontan,
Q.-H. Duong,
L. Buchaillot,
D. Peyrou,
P. Pons:
Biaxial initial stress characterization of bilayer gold RF-switches.
Microelectronics Reliability 45(9-11): 1776-1781 (2005) |
2 | EE | Q.-H. Duong,
L. Buchaillot,
D. Collard,
P. Schmitt,
X. Lafontan,
P. Pons,
F. Flourens,
F. Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches.
Microelectronics Reliability 45(9-11): 1790-1793 (2005) |
2003 |
1 | EE | L. Buchaillot:
Feedback of MEMS reliability study on the design stage: a step toward Reliability Aided Design (RAD).
Microelectronics Reliability 43(9-11): 1919-1928 (2003) |