| 2005 |
|---|
| 11 | EE | Sudheendra Hangal,
Naveen Chandra,
Sridhar Narayanan,
Sandeep Chakravorty:
IODINE: a tool to automatically infer dynamic invariants for hardware designs.
DAC 2005: 775-778 |
| 2004 |
|---|
| 10 | EE | Sudheendra Hangal,
Durgam Vahia,
Chaiyasit Manovit,
Juin-Yeu Joseph Lu,
Sridhar Narayanan:
TSOtool: A Program for Verifying Memory Systems Using the Memory Consistency Model.
ISCA 2004: 114-123 |
| 1997 |
|---|
| 9 | EE | Sridhar Narayanan,
R. Srinivasan,
R. P. Kunda,
Marc E. Levitt,
Saied Bozorgui-Nesbat:
A fault diagnosis methodology for the UltraSPARCTM-I microprocessor.
ED&TC 1997: 494-500 |
| 8 | | Sridhar Narayanan,
Ashutosh Das:
An Efficient Scheme to Diagnose Scan Chains.
ITC 1997: 704-713 |
| 1995 |
|---|
| 7 | | Marc E. Levitt,
Srinivas Nori,
Sridhar Narayanan,
G. P. Grewal,
Lynn Youngs,
Anjali Jones,
Greg Billus,
Siva Paramanandam:
Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor.
ITC 1995: 157-166 |
| 6 | EE | Sridhar Narayanan,
Melvin A. Breuer:
Asynchronous multiple scan chain.
VTS 1995: 270-276 |
| 5 | EE | Sridhar Narayanan,
Melvin A. Breuer:
Reconfiguration techniques for a single scan chain.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(6): 750-765 (1995) |
| 1993 |
|---|
| 4 | EE | Sridhar Narayanan,
Melvin A. Breuer:
Reconfigurable scan chains: a novel approach to reduce test application time.
ICCAD 1993: 710-715 |
| 3 | | Sridhar Narayanan,
Rajesh Gupta,
Melvin A. Breuer:
Optimal Configuring of Multiple Scan Chains.
IEEE Trans. Computers 42(9): 1121-1131 (1993) |
| 1992 |
|---|
| 2 | EE | Sridhar Narayanan,
Rajesh Gupta,
Melvin A. Breuer:
Configuring multiple scan chains for minimum test time.
ICCAD 1992: 4-8 |
| 1 | | Sridhar Narayanan,
Charles Njinda,
Melvin A. Breuer:
Optimal Sequencing of Scan Registers.
ITC 1992: 293-302 |
